Publications
Presentations
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Huang, Qicheng, Chenlei Fang, and RD Shawn Blanton. "Diagnosis Outcome Prediction on Limited Data via Transferred Random Forest." 2020 IEEE International Test Conference in Asia (ITC-Asia). IEEE, 2020. [VIDEO]
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Fang, Chenlei, Qicheng Huang, and RD Shawn Blanton. "Adaptive Test Pattern Reordering for Diagnosis using k-Nearest Neighbors." 2020 IEEE International Test Conference in Asia (ITC-Asia). IEEE, 2020. [VIDEO]
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Huang, Qicheng, Chenlei Fang, and RD Shawn Blanton. "LAIDAR: Learning for Accuracy and Ideal Diagnostic Resolution." 2020 IEEE International Test Conference (ITC). IEEE, 2020. [VIDEO]
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Qicheng Huang and Chenlei Fang. "MADS: Machine Learning Assisted Diagnosis System" 2020. [VIDEO]
Advanced Chip
Test Laboratory.
The Advanced Chip Test Laboratory (ACTL) at Carnegie Mellon University develops and implements data-mining techniques for improving the operation, design, manufacturing and testing of integrated systems. Our research involves data-mining algorithm development, data analysis, chip design and fabrication in collaboration with various industrial partners that currently include IBM, NVIDIA, Qualcomm, CISCO Systems, Intel, GlobalFoundries, and ARM. The founder and head of ACTL is Prof. Shawn Blanton.