News

2015

Shawn Blanton named Associate Director of the he SYSU-CMU Joint Institute of Engineering (JIE).

Shawn Blanton gives invited talk at the 2015 IEEE VLSI Test Symposium held in Napa, California.

Ph.D. student Ben Niewenhuis awarded inaugraual IBM SRC Denard Fellowship.

2014

Ben Niewenhuis is awarded the 2013-14 Northrop Grumman Fellowship.

Shawn Blanton gives the keynote talk at the 2014 Asian Test Symposium in Hangzhou, China.

Shawn Blanton gives an invited talk at the 2014 International Symposium on Integrated Circuits Conference in Singapore.

Xin Li, Shawn Blanton, Pulkit Grover and Donald Thomas win the Best Paper Award at the 2014 International Symposium on Integrated Circuits Conference, Dec. 2014.

Ben Niewenhuis wins a 2014 Bradford and Diane Smith Graduate Fellowship.

2013

ECE Ph.D. student Matthew Beckler has been selected to receive the 2013 Carnegie Mellon University Graduate Student Service Award. Presented annually during Graduate Student Appreciation Week (this year, April 1–5), the award encourages and recognizes exemplary service to both graduate students and the university — someone who has contributed to an improved quality of life for graduate students; the entire academic community; and even, in this case, the education of Pittsburgh.

Shawn Blanton gives keynote address at the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) in Abu Dhabi, UAE. Talk title: “Improving Design, Manufacturing and Even Test Through Test-Data Mining”

Shawn Blanton is interviewed for the “Still Feel Like Going On” interview project. Feel Like Going On is a collective of Black photographers showcasing the positive and uplifting side of Black life and times in the Pittsburgh and surrounding regions.

Shawn Blanton among the authors for the Donald O. Pederson Best Paper Award for the IEEE Transaction on CAD of Integrated Circuits and Systems for the paper titled: “Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits,” IEEE Transaction on Computer-Aided Design of Integrated Circuits and Systems, Vol. 30, Issue: 12, pp. 1814 - 1827, December 2011.

2012

Shawn Blanton gave an Invited talk at the 2012 China Semiconductor Technology International Conference (CSTIC) in Shanghai. Title of his talk: “Improving Design, Manufacturing and Even Test Through Test-Data Mining”

Shawn Blanton poses with Steely McBean (mascot of the Pittsburgh Steelers professional football team) while recruiting at the 2012 National Society of Black Engineers convention in Pittsburgh, Pennsylvania.

Shawn Blanton gives an invited talk at the DCG After ISTFA Workshop in Phoenix, Arizona. Talk title: “Improving Defect Resolution via Physically-Aware Diagnosis.”

Matthew Beckler has been selected to receive a Bertucci Graduate Fellowship. This fellowship was created through the generosity of John and Claire Bertucci and it was established to provide merit fellowships to graduate students pursuing doctoral degrees in Engineering at Carnegie Mellon University.

2011

Mitchell Martin is named a recipient of the prestigious Ford Foundation Fellowship.

Mitchell Martin is named a recipient of the prestigious NSF Fellowship.

SRC Global Research Collaboration awards an IBM/GRC Fellowship to Mitchell Martin.

Wing Chiu (Jason) Tam earned first place in the semi-final competition for the E. J. McCluskey Doctoral Thesis Award at the 2011 VLSI Test Symposium held in Dana Point, CA. Sponsored by the Test Technology Technical Council (TTTC), this award is given to the winner of a two-stage contest with semi-finals held at TTTC-sponsored events. The winners of the semi-finals, determined by jurys composed of industrial experts, will compete against each other in the finals, held at the 2011 International Test Conference in Anaheim, CA. This major Award is named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability.

Wing Chiu (Jason) Tam earned first place in the ACM Student Research Competition (SRC) held during the Design Automation Conference in San Diego. Sponsored by Microsoft Research, the SRC offers a unique forum for students to present their original research before a panel of judges and attendees. The competition begins with a poster session to determine the semifinalists that go on to deliver short presentations for a panel of judges. As the first prize winner in the graduate student category, Tam will compete in the ACM Grand Finals next June.

Shawn Blanton gave an Invited talk at the 2011 International Conference on Materials for Advanced Technologies (ICMAT) in Singapore. Title of his talk: “Improving Design, Manufacturing and Even Test Through Test-Data Mining”

Mitchell Martin is awarded an AISES Intel Scholarship.

Wing Chiu (Jason) Tam won the TTTC's E. J. McCluskey Doctoral Thesis award during the International Test Conference 2011 in Anaheim, California. The Award serves the purpose to promote the most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. Jason's dissertation, “Physically Aware Analysis of Systematic Defects in ICs,” addresses the problem of information extraction from IC failure diagnosis data in order to provide feedback to designers for product yield improvement.

Shawn Blanton serves as 2011 Program Chair for the International Test Conference, held at Disneyland in Anaheim, California.

Advanced   Chip   
Test  Laboratory.

The Advanced Chip Test Laboratory (ACTL) at Carnegie Mellon University develops and implements data-mining techniques for improving the operation, design, manufacturing and testing of integrated systems. Our research involves data-mining algorithm development, data analysis, chip design and fabrication in collaboration with various industrial partners that currently include IBM, NVIDIA, Qualcomm, CISCO Systems, Intel, GlobalFoundries, and ARM. The founder and head of ACTL is Prof. Shawn Blanton.

Advanced Chip Test Laboratory,

5000 Forbes Ave, Pittsburgh,PA 15213-3890

Tel: 412.268.2987

Email: rblanton@andrew.cmu.edu

ACTL .

© Copyrigh-Advanced Chip Test Laboratory.Updated 4/28/2019